VOL-5298:OpenOnuAdapterGo: Panic during scale tests if large number of ONTS flap during ACTIVATION
[VOL-5331] - Sanity E2E Test for OLT/ONU on POD for DT :: Validates E2E Ping Co... | FAIL |
Change-Id: I369de3b525c4e0db4dbf1527494320826bd0f7de
Signed-off-by: PRANEETH NALMAS <praneeth.nalmas@radisys.com>
diff --git a/internal/pkg/core/device_handler.go b/internal/pkg/core/device_handler.go
index 08045c9..c4dd037 100755
--- a/internal/pkg/core/device_handler.go
+++ b/internal/pkg/core/device_handler.go
@@ -4690,6 +4690,10 @@
return resp
}
+func (dh *deviceHandler) GetDeviceDeleteCommChan(ctx context.Context) chan bool {
+ return dh.deviceDeleteCommChan
+}
+
// PrepareForGarbageCollection - remove references to prepare for garbage collection
func (dh *deviceHandler) PrepareForGarbageCollection(ctx context.Context, aDeviceID string) {
logger.Debugw(ctx, "prepare for garbage collection", log.Fields{"device-id": aDeviceID})